Optimizing the performance of electrostatic-doped SiGe/Si heterostructure nanotube TFET by material analysis evaluating analog and linear parameters
Crossref DOI link: https://doi.org/10.1557/s43579-025-00778-x
Published Online: 2025-07-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sen, Soumya https://orcid.org/0000-0002-6354-5206
Khosla, Mamta
Raman, Ashish
Text and Data Mining valid from 2025-07-08
Version of Record valid from 2025-07-08
Article History
Received: 27 May 2025
Accepted: 1 July 2025
First Online: 8 July 2025
Declarations
:
: No conflicts of interest.