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Far-IR Sb-O vibrations in annealed sputtered films of Sb2Te3 for thermoelectric THz detector applications

Crossref DOI link: https://doi.org/10.1557/s43580-026-01702-8

Published Online: 2026-07-01

Published Print: 2026-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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