Microscale shear specimens for evaluating the shear deformation in single-crystal and nanocrystalline Cu and at Cu–Si interfaces
Crossref DOI link: https://doi.org/10.1557/jmr.2019.104
Published Online: 2019-04-24
Published Print: 2019-05-14
Update policy: https://doi.org/10.1017/policypage
Gigax, Jonathan G. http://orcid.org/0000-0002-0456-6066
Baldwin, Jon K.
Sheehan, Chris J.
Maloy, Stuart A.
Li, Nan
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License: Copyright © Materials Research Society 2019