Residual stress–driven test technique for freestanding ultrathin films: Elastic behavior and residual strain
Crossref DOI link: https://doi.org/10.1557/jmr.2019.278
Published Online: 2019-10-14
Published Print: 2019-10-28
Update policy: https://doi.org/10.1017/policypage
Cuddalorepatta, Gayatri K. http://orcid.org/0000-0002-3757-9277
Sim, Gi-Dong
Li, Han
Pantuso, Daniel
Vlassak, Joost J.
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License: Copyright © Materials Research Society 2019