at]Hard-switching reliability studies of 1200 V vertical GaN PiN diodes
Crossref DOI link: https://doi.org/10.1557/mrc.2018.204
Published Online: 2018-09-28
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Slobodyan, O.
Smith, T.
Flicker, J.
Sandoval, S.
Matthews, C.
van Heukelom, M.
Kaplar, R.
Atcitty, S.
Text and Data Mining valid from 2018-09-28
Version of Record valid from 2018-09-28
Article History
Received: 2 July 2018
Accepted: 14 September 2018
First Online: 28 September 2018