Automated self-assembly and electrical characterization of nanostructured films
Crossref DOI link: https://doi.org/10.1557/mrc.2018.47
Published Online: 2018-04-02
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hensel, Rafael C.
Rodrigues, Kevin L.
Pimentel, Vinicius do L.
Riul, Antonio Jr.
Rodrigues, Varlei
Text and Data Mining valid from 2018-04-02
Version of Record valid from 2018-04-02
Article History
Received: 11 January 2018
Accepted: 19 March 2018
First Online: 2 April 2018