Capacitance-based defect detection and defect location determination for cement-based material
Crossref DOI link: https://doi.org/10.1617/s11527-017-1094-7
Published Online: 2017-10-24
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Yulin
Chung, D. D. L. https://orcid.org/0000-0002-4746-6276
License valid from 2017-10-24