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Long working distance portable smartphone microscopy for metallic mesh defect detection

Published Online: 2025-08-01

Published Print: 2025-07

Authors

Lu, Zhengang https://orcid.org/0000-0001-6490-5819
Qin, Hongsheng

Li, Jing

Sun, Ming

Tan, Jiubin
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Text and Data Mining valid from 2025-07-01

Version of Record valid from 2025-07-01
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Article History

Received: 13 November 2024

Accepted: 13 January 2025

First Online: 1 August 2025

Conflict of interest

: Zhengang LU and Jiubin TAN are a corresponding expert and an editorial board member of Frontiers of Information Technology & Electronic Engineering, respectively; they were not involved with the peer review process of this paper. All the authors declare that they have no conflict of interest.

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