Effective fault detection in M3D ICs: a cluster-based BIST for enhanced inter-layer via fault coverage
Crossref DOI link: https://doi.org/10.1631/FITEE.2401094
Published Online: 2025-11-17
Published Print: 2025-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jahanirad, Hadi https://orcid.org/0000-0001-8586-6281
Menbari, Ahmad
Rahimi, Hemin
Ziener, Daniel
Text and Data Mining valid from 2025-10-01
Version of Record valid from 2025-10-01
Article History
Received: 26 December 2024
Accepted: 24 June 2025
First Online: 17 November 2025
Conflict of interest
: All the authors declare that they have no conflict of interest.