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Dynamic Light Scattering Measurements for Soft Materials on Solid Substrates: Employing Evanescent-wave Illumination and Dark-field Collection with a High Numerical Aperture Microscope Objective

Crossref DOI link: https://doi.org/10.2116/analsci.20P068

Published Online: 2020-05-15

Published Print: 2020-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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