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Total-Electron-Yield Measurements by Soft X-Ray Irradiation of Insulating Organic Films on Conductive Substrates

Crossref DOI link: https://doi.org/10.2116/analsci.20P171

Published Online: 2020-08-21

Published Print: 2020-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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