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Determination of Trace Elements in Sintered and Single-Crystal Silicon Carbide by Laser Ablation in Liquid Inductively Coupled Plasma Mass Spectrometry

Crossref DOI link: https://doi.org/10.2116/analsci.33.537

Published Online: 2017-04-10

Published Print: 2017-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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