Quantitative Analysis of Trace Elements in Silicate Glass Sample by LA-ICP-QMS/QMS with an ORC: Silicon as the Matrix of Calibrating Solutions and the Internal Standard for Measurement
Crossref DOI link: https://doi.org/10.2116/analsci.32.1237
Published Online: 2016-11-10
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhu, Yanbei
Text and Data Mining valid from 2016-11-01
Version of Record valid from 2016-11-01
Article History
Received: 2 June 2016
Accepted: 20 July 2016
First Online: 10 November 2016