Preparation and microstructural characterization of Si(100) Ce1−x GdxO2−δ thin films prepared by pulsed laser deposition technique
Crossref DOI link: https://doi.org/10.2478/s13536-014-0246-5
Published Online: 2014-12-19
Published Print: 2014-12-01
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Nagaraju, P.
Vijayakumar, Y.
Phase, D.
Reddy, V.
Ramana Reddy, M.
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