Electrothermal analysis of GaN power submicron field-effect heterotransistors
Crossref DOI link: https://doi.org/10.3103/S0735272716020035
Published Online: 2016-03-30
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Timofeyev, V. I.
Semenovskaya, E. V.
Falieieva, O. M.
Text and Data Mining valid from 2016-02-01