Possibilities of ion-beam diagnostics of thin-film epitaxial and nonoriented structures
Crossref DOI link: https://doi.org/10.3103/S1062873814060100
Published Online: 2014-07-05
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Egorov, V. K.
Egorov, E. V.
Afanas’ev, M. S.
Text and Data Mining valid from 2014-06-01