Changes in the microhardness and dielectric permittivity of TGS crystals after their exposure to a static magnetic field or ultralow crossed fields in the EPR scheme
Crossref DOI link: https://doi.org/10.3103/S1062873814100177
Published Online: 2014-10-21
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Petrzhik, E. A.
Ivanova, E. S.
Alshits, V. I.
Text and Data Mining valid from 2014-10-01
