Investigating the electronic structure of tetramethylsilane by means of X-ray spectroscopy and theoretical calculations
Crossref DOI link: https://doi.org/10.3103/S1062873815110064
Published Online: 2015-11-25
Published Print: 2015-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Danilenko, T. N.
Tatevosyan, M. M.
Vlasenko, V. G.
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