Investigating 64Zn+ ion-doped silicon under conditions of hot implantation
Crossref DOI link: https://doi.org/10.3103/S1062873816020246
Published Online: 2016-03-31
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Privezentsev, V. V.
Kulikauskas, V. S.
Zatekin, V. V.
Kirilenko, E. P.
Goryachev, A. V.
Batrakov, A. A.
Text and Data Mining valid from 2016-02-01