Electronic structure of SiO2: An X-ray emission spectroscopic and density functional theoretical study
Crossref DOI link: https://doi.org/10.3103/S1062873816060113
Published Online: 2016-07-15
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Danilenko, T. N.
Tatevosyan, M. M.
Vlasenko, V. G.
License valid from 2016-06-01