Method for predicting the effects of radiative relaxation in bipolar integrated circuits
Crossref DOI link: https://doi.org/10.3103/S1062873816090343
Published Online: 2016-10-04
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Panyushkin, N. N.
Matveev, N. N.
Text and Data Mining valid from 2016-09-01
Version of Record valid from 2016-09-01
Article History
First Online: 4 October 2016