One possibility of mathematically modeling the thermal effect of a finely focused electron beam on a homogeneous semiconductor
Crossref DOI link: https://doi.org/10.3103/S1062873816100038
Published Online: 2016-11-09
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Amrastanov, A. N.
Ginzgeymer, S. A.
Stepovich, M. A.
Filippov, M. N.
License valid from 2016-10-01