X-Ray diffraction line profile analysis of the microstructure of micro- and nanosized alumina particles
Crossref DOI link: https://doi.org/10.3103/S1062873817110193
Published Online: 2017-12-16
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tarasova, E. Yu.
Kuznetsov, S. I.
Panin, A. S.
Nefedov, S. A.
License valid from 2017-11-01