Mathematical Modeling of Heat and Mass Transfer Phenomena Caused by Interaction between Electron Beams and Planar Semiconductor Multilayers
Crossref DOI link: https://doi.org/10.3103/S1062873820070138
Published Online: 2020-08-20
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kalmanovich, V. V.
Seregina, E. V.
Stepovich, M. A.
Text and Data Mining valid from 2020-07-01
Version of Record valid from 2020-07-01
Article History
Received: 18 February 2020
Revised: 16 March 2020
Accepted: 27 March 2020
First Online: 20 August 2020