On the circuits reliability in “anticonjunction” basis with constant faults at gate inputs
Crossref DOI link: https://doi.org/10.3103/S1066369X1607001X
Published Online: 2016-06-16
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Alekhina, M. A.
Kurysheva, V. V.
License valid from 2016-06-16