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On Regulation Accuracy of Current and Voltage Discrete Values in Testing Facilities of Semiconductor Devices

Published Online: 2022-09-29

Published Print: 2022-07

Authors

Antonov, S. N.

Oskin, S. V.

Anikuev, S. V.

Yarosh, V. A.
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Text and Data Mining valid from 2022-07-01

Version of Record valid from 2022-07-01
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Article History

Received: 6 May 2022

Revised: 11 May 2022

Accepted: 12 May 2022

First Online: 29 September 2022

CONFLICT OF INTEREST

: The authors declare that they have no conflicts of interest.

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