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Erratum to: Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads

Published Online: 2025-12-16

Published Print: 2025-10

Authors

Khorolsky, V. Ya.

Isupova, A. M.

Yundin, K. M.

Sharipov, I. K.
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Text and Data Mining valid from 2025-10-01

Version of Record valid from 2025-10-01
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Article History

Received: 6 November 2025

Revised: 6 November 2025

Accepted: 6 November 2025

First Online: 16 December 2025

Free to read: This content has been made available to all.

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