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Advanced Spectroscopic Ellipsometry Analysis of Thickness-Dependent Optical Constants and Surface Morphological Variations in Aluminum Thin Films

Published Online: 2025-12-29

Published Print: 2025-12

Authors

Ahmadova, Kh. N.

Jabarov, S. H.

Mirzayev, M. N.

Tuan, P. L.
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Text and Data Mining valid from 2025-12-01

Version of Record valid from 2025-12-01
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Article History

Received: 18 June 2025

Revised: 9 July 2025

Accepted: 27 July 2025

First Online: 29 December 2025

CONFLICT OF INTEREST

: The authors of this work declare that they have no conflicts of interest.

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