Measuring the Interatomic Distance in a Silicon Crystal Lattice Using an Optical Scanning Interferometer
Crossref DOI link: https://doi.org/10.3103/S8756699021060157
Published Online: 2022-05-13
Published Print: 2021-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sysoev, E. V.
Latyshev, A. V.
Text and Data Mining valid from 2021-12-01
Version of Record valid from 2021-12-01
Article History
Received: 19 July 2021
Revised: 2 August 2021
Accepted: 4 August 2021
First Online: 13 May 2022
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.