On tests detecting certain faults of circuit inputs for almost all Boolean functions
Crossref DOI link: https://doi.org/10.3103/S0278641915010045
Published Online: 2015-02-27
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Morozov, E. V.
Text and Data Mining valid from 2015-01-01