Computer analysis of the AFM images of the nanopore system on the SiO2/Si structure surface, obtained by Zn ion implantation
Crossref DOI link: https://doi.org/10.3103/S1062873814090287
Published Online: 2014-09-24
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sokolov, V. N.
Razgulina, O. V.
Privesentsev, V. V.
Petrov, D. V.
Text and Data Mining valid from 2014-09-01