Correlation between Defect Structure and the Strength Properties of Silicon for Various Means of Plastic Deformation
Crossref DOI link: https://doi.org/10.3103/S1062873819100228
Published Online: 2019-11-01
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Velikhanov, A. R.
Text and Data Mining valid from 2019-10-01
Version of Record valid from 2019-10-01
Article History
Received: 10 January 2019
Revised: 13 May 2019
Accepted: 27 June 2019
First Online: 1 November 2019