Features of the Semiconductor Surface structure containing silver particles on the porous Silicon Film Surface Formed by Metal-Assisted Etching
Crossref DOI link: https://doi.org/10.3103/S1068335621010048
Published Online: 2021-03-01
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Melnik, N. N.
Tregulov, V. V.
Rybin, N. B.
Rybina, N. V.
Ivanov, A. I.
Text and Data Mining valid from 2021-01-01
Version of Record valid from 2021-01-01
Article History
Received: 5 September 2020
Revised: 15 September 2020
Accepted: 16 September 2020
First Online: 1 March 2021