Atomic structure of extended defects in boron-implanted silicon layers
Crossref DOI link: https://doi.org/10.3103/S8756699014030042
Published Online: 2014-07-25
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fedina, L. I.
Gutakovskii, A. K.
Latyshev, A. V.
Text and Data Mining valid from 2014-05-01