Analytical Model of an Optoelectronic Probe for Measuring Small Axial Displacements
Crossref DOI link: https://doi.org/10.3103/S8756699021010064
Published Online: 2021-07-12
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mineev, A. V.
Yasoveev, V. Kh.
Text and Data Mining valid from 2021-01-01
Version of Record valid from 2021-01-01
Article History
Received: 21 February 2020
Revised: 12 November 2020
Accepted: 23 November 2020
First Online: 12 July 2021