A Comprehensive Study on Failure Modes and Mechanisms of Thin Film Chip Resistors
Crossref DOI link: https://doi.org/10.35940/ijeat.C4355.13020224
Published Online: 2024-02-28
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Dash, Dr. Sarat Kumar http://orcid.org/0009-0003-4876-1650
Kamat, Sandhya V.
Journal Name
: International Journal of Engineering and Advanced Technology (IJEAT)
Funding
: No, I did not receive.
Conflicts of Interest
: No conflicts of interest to the best of our knowledge.
Ethical Approval and Consent to Participate
: No, the article does not require ethical approval and consent to participate with evidence.
Availability of Data and Material
: Not relevant.
Authors Contributions
: All authors have equal participation in this article.
