Automated Defect Inspection Algorithm Incorporated Spectral-Domain Optical Coherence Tomography for Optical Polarizing Thin Films
Crossref DOI link: https://doi.org/10.35940/ijeat.C5515.029320
Published Online: 2020-02-28
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Jeon, Byeonggyu
Han, Youngmin
Wijesinghe, Ruchire Eranga
Jeon, Mansik
Kim, Jeehyun