A New Efficient Forgery Detection Method using Scaling, Binning, Noise Measuring Techniques and Artificial Intelligence (Ai)
Crossref DOI link: https://doi.org/10.35940/ijitee.I9703.0812923
Published Online: 2023-08-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
,
Enumula, Mahesh http://orcid.org/0009-0009-5931-3830
Giri, Dr. M.
Sharma, Dr. V. K.
Journal Name
: International Journal of Innovative Technology and Exploring Engineering (IJITEE)
Funding
: No Funding.
Conflicts of Interest
: No conflicts of interest to the best of our knowledge.
Ethical Approval and Consent to Participate
: No, the article does not require ethical approval and consent to participate with evidence.
Availability of Data and Material
: Not relevant.
Authors Contributions
: All authors having equal contribution for this article.
