Attendance Management System using Deep Learning and Facial Recognition Technique
Crossref DOI link: https://doi.org/10.35940/ijitee.J9423.0881019
Published Online: 2019-08-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Saoji, Prof. S.U.
kumar, Dr. Naveen
Jayakumar,
Gupta, Vaibhav
Agarwal, Prakhar
astogi, Parth