Generation of Reduced Test Vectors for Multiple Stuck at Faults using Genetic Algorithm
Crossref DOI link: https://doi.org/10.35940/ijitee.K1271.0981119
Published Online: 2019-09-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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A, Mrs. Abhinaya
B, Veena M
