Leakage Current Analysis of 6T & 7T-SRAM using FINFETs at 22nm Technology
Crossref DOI link: https://doi.org/10.35940/ijitee.K2292.1081219
Published Online: 2019-10-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Kumar*, N.Praveen
Charles, Dr.B.Stephen
Sumalatha, Dr.V.