Defect Detection using Active Contour Method
Crossref DOI link: https://doi.org/10.35940/ijrte.D4509.118419
Published Online: 2019-11-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Chaitanya*, V. Krishna
manikanta, N. Pranay
Kumar, S. Mukesh
Kumar, M. Anil
Suresh, B.
Ghali, Dr.V.S.