Machine Learning Techniques to Predict Defects by using Testing Parameters
Crossref DOI link: https://doi.org/10.35940/ijrte.D5396.118419
Published Online: 2019-11-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Yalla*, Prasanth
Mandhala, Venkata Naresh
Abhishiktha, Valavala
Saisree, Chitturi
Manogna, Kandepi