Enhancement of Commercial Grade VLSI Chips into Industrial Grade using a Novel Thermal Monitoring and Control Technique
Crossref DOI link: https://doi.org/10.35940/ijrte.E6410.018520
Published Online: 2020-01-30
Update policy: https://doi.org/10.35940/beiesp.crossmarkpolicy
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Magadum*, Sachin
Guhilot, Hansraj
