A New Efficient Forgery Detection Method using Scaling, Binning, Noise Measuring Techniques and Artificial Intelligence (Ai)
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Published Online: 2023-08-30
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Giri, Dr. M.
Sharma, Dr. V. K.
International Journal of Innovative Technology and Exploring Engineering (IJITEE)
Conflicts of Interest
No conflicts of interest to the best of our knowledge.
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No, the article does not require ethical approval and consent to participate with evidence.
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All authors having equal contribution for this article.