Item exposure control for multidimensional computer adaptive testing under maximum likelihood and expected a posteriori estimation
Crossref DOI link: https://doi.org/10.3758/s13428-015-0659-z
Published Online: 2015-10-20
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Huebner, Alan R.
Wang, Chun
Quinlan, Kari
Seubert, Lauren
Text and Data Mining valid from 2015-10-20