A dual memory theory of the testing effect
Crossref DOI link: https://doi.org/10.3758/s13423-017-1298-4
Published Online: 2017-06-05
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rickard, Timothy C.
Pan, Steven C.
License valid from 2017-06-05