Thickness dependences of the structural optical, and electrical properties of Cu2 Se thin films grown by using DC magnetron sputtering
Crossref DOI link: https://doi.org/10.3938/jkps.64.1600
Published Online: 2014-06-05
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ahn, Heejin
Um, Youngho
Text and Data Mining valid from 2014-05-01
