Current transport analysis of ZrO2 thin films: Effects of post-deposition annealing
Crossref DOI link: https://doi.org/10.3938/jkps.65.1903
Published Online: 2015-01-07
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeong, Heejun
Text and Data Mining valid from 2014-12-01
