Effects of controlling the interface trap densities in InGaZnO thin-film transistors on their threshold voltage shifts
Crossref DOI link: https://doi.org/10.3938/jkps.65.1919
Published Online: 2015-01-07
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeong, S-W.
Lee, J-T.
Roh, Y.
Text and Data Mining valid from 2014-12-01